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Invitation Letter | GIF Continuum with Stela - Advanced EELS and Energy Filtering 4D STEM Seminar Based on Hybrid Pixel Detection
Date: 2025-11-10Read: 8
GIF Continuum with Stela - Advanced EELS and Energy Filtering 4D STEM Seminar and Equipment Demonstration Based on Hybrid Pixel Detection
Quantum Valley, Henan Academy of Sciences
November 25, 2025 (Tuesday) 09:30-17:00
Hybrid Pixel Detector (such as Gatan Stela camera) is a new electronic detection technology that has rapidly developed and been applied in the field of electron microscopy characterization in recent years. Hybrid pixel detectors have advantages such as high speed, high dynamic range, and high sensitivity, making them an ideal choice for high-order diffraction characterization applications such as MicroED (3DED) and 4D STEM. On this basis, Gatan successfully integrated a hybrid pixel detector and applied it to the GIF Continuum with Stela system, which combines the advantages of hybrid pixel detection with energy filtering. It can achieve diffraction imaging research with energy filtering, eliminate the adverse effects of inelastic scattering on the results, improve the clarity, signal-to-noise ratio, and details of diffraction spots/diffraction disks, bring higher quality raw data, and improve the structural analysis results and success rate.
The GIF Continuum with Stela system is not only a tool for diffraction research, but equally important, it can bring a qualitative leap to energy loss spectroscopy (EELS) characterization. GIF Continuum with Stela uses a 1024 * 512 pixel large format Stela camera, which can capture detailed spectral lines with almost zero noise at a high speed of up to 9000 spectra/second. Compared with traditional scintillator fiber coupled cameras, it can handle various samples, from conventional samples to systems such as electron beam sensitive oxides, polymers, molecular sieves, and other radiation resistant systems, obtaining unprecedented high spatial resolution and high signal-to-noise ratio spectral line information, including high-energy edge core loss signals with small inelastic scattering cross sections. This significantly improves the quality and efficiency of EELS characterization, and brings new possibilities for the study of materials and systems that are difficult to characterize with high spatial resolution under electron microscopy.
The advantages of hybrid pixel detection combined with energy filtering in EELS and diffraction characterization include but are not limited to:
Collecting highly detailed restored EELS spectral line fine structure
Spectral analysis of irradiation sensitive samples at low doses
Analysis of EELS surface distribution with large area and high spatial resolution obtained at high speed
Obtain time-resolved in situ EELS spectroscopic information
Multi frame cumulative dose segmentation surface scanning for smaller radiation damage and better drift correction
High signal-to-noise ratio 4D STEM data acquisition for energy filtering
MicroED data acquisition for energy filtering to obtain more accurate crystal structures
And more
Through this face-to-face technical seminar, you will gain a comprehensive understanding of how the GIF/EELS system, which utilizes mixed pixel detection technology, can improve the performance of micro area analysis electron microscopy characterization under (S) TEM from multiple dimensions such as technical principles, application case sharing, and practical experience. The seminar will consist of invited academic reports, technical reports, and practical demonstrations, with the practical part being conducted on JEOL JEM-ARM300F2 equipped with Gatan GIF Continuum with Stela The system is also equipped with a conventional scintillator camera, so you can intuitively see the significant improvement in spectral line quality brought by the hybrid pixel camera compared to traditional cameras under the same electron beam illumination and acquisition conditions. Especially for samples that are not resistant to electron beam irradiation, it is possible to obtain spectral information of the sample with a smaller electron dose and lower irradiation damage.
01 Time&Location
November 25th, 2025 (Tuesday), 09:30-17:00
Electron Microscopy Center, Institute of Quantum Materials and Physics, Henan Academy of Sciences
No. 26 Hanyue Street, Guancheng Hui District, Zhengzhou City, Zhongyuan Quantum Valley (near Zhengzhou East Station)
02 Schedule
03 Sign up
There is no attendance fee for this seminar. Please arrange your own transportation and travel.
We look forward to your attendance and hope to further communicate with you to help us better understand your needs and challenges in electron microscopy characterization!
Please register through the sales representative in your area or by scanning the QR code below:
The typical energy loss spectrum collected from the Stela camera has a single spectrum energy range of 1500 eV, with excellent signal-to-noise ratio and high energy resolution spectral line details from low-energy to high-energy elements.
Comparison of CBED pattern quality before and after GIF energy filtering (elastography).
Special thanks:
The strong support of Henan Academy of Sciences and Institute of Quantum Materials and Physics for this technical seminar, as well as the wonderful academic sharing brought by Professor Cheng Shaobo!