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Changzhou Yichen Instrument Manufacturing Co., Ltd

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Structural Description of High and Low Temperature (Alternating) Test Chamber Equipment
Date: 2023-01-12Read: 4
The GDW series high and low temperature test chamber is suitable for reliability testing of industrial products at high and low temperatures. Inspect the performance indicators of components and materials of electronic and electrical products, automobiles and motorcycles, aerospace, marine weapons, universities, research institutions and other related products under high and low temperature (alternating) cyclic changes.
Structural description of high and low temperature (alternating) test chamber equipment:
(1) There are observation windows, frost prevention devices, and switchable lighting fixtures on the box door. The observation window adopts multi-layer hollow tempered glass, and the inner adhesive sheet conductive film is heated and defrosted. The lighting adopts Philips lamps, which can effectively observe the experimental changes in the studio.
(2) The double-layer high temperature and anti-aging silicone rubber seal can effectively ensure the temperature loss of the test chamber.
(3) Inside the air duct interlayer at one end of the studio, there are devices such as heaters, refrigeration evaporators, and fan blades distributed; On the left side of the test box, there is a Ø 50 cable hole, and the test box is a single door (stainless steel embedded door handle).
(4) The test box body is in the form of an integral structure, with the refrigeration system located at the lower rear of the box and the control system located at the upper part of the test box.