144nm high-resolution 2D calibration standards (for AFM, STM, Auger, FIB, SEM)

Silicon wafer size:4*3*0.5mmThe pattern is made of aluminum metal (approximately height)90nm, wide75nmThis parameter is not calibrated, please note that its pattern is covered with silicon wafers,2DHolographic array, spacing144nmSpray tungsten film on the surface, accuracy ±1nm.

There are two types of products provided:Model 150-2DandModel 150-2DUTCAmong themModel 150-2DCalibration standard sample,Certified by the manufacturer,Untraceable;Model 150-2DUTCCalibration standard sample,certification,traceable,Provide certificates（PTB,a German counterpart of NIST）.

We recommendModel 150-2DIts unique characteristics make the application very convenient, the standard sample is sturdy and durable, and can be scanned in contact mode, providing fast calibration and measurement:

l 2Dpattern,Xaxis andYSimultaneous axis calibration

l Even if the probe is passivated, it does not affect the image contrast

l Contact scanning can obtain high contrast images

l Whole piece coverage saves time searching for scanning areas

l Not only for high magnification applications, but also for medium magnification applications5 kXAt that time, a single circular body can still be clearly distinguished

AFM Tapping Mode Scan

SEM Medium Magnification

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