Atomic force microscope confocal spectrometer

Atomic force microscope confocal spectrometer NanFlex

This product is an equipment that integrates multiple advanced technologies such as atomic force microscopy, Raman spectroscopy, and scanning probe microscopy.

Purpose:
Chemistry. Combining scanning probe spectroscopy and confocal Raman spectroscopy to analyze the composition and structure of organic and inorganic compounds;
Physics. Analyze the physical properties of different substrates;
biology Study the interactions between organizations, cells, cell structures, and biomolecules;
Interdisciplinary analysis. Nanotechnology, pharmacology, materials science, mineralogy, geology, oil painting analysis, etc;

Application:
Scanning probe spectra;
Scanning confocal Raman spectroscopy;
Near field scanning spectroscopy;
Enhanced Raman Spectroscopy with Probes (TERS);
Enhanced Probe Fluorescence Spectroscopy (TEFS);

Advantages of NanoFlex:
Synchronous confocal spectroscopy, morphological information;
Obtain scanning spectra of the sample surface;
Merge operation of scanning platform and scanning head;
Horizontal placement of optical mechanisms;
Can be used in conjunction with upright and inverted microscopes to measure transparent or opaque samples;
Multi institutional linkage software;

NanoFlex integrates:
Scanning probe microscope;
Optical microscope (upright or inverted);
Confocal laser microscope;
Raman spectrometer, fluorescence spectrometer;