German Spike Small Point Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer Precious Metal Detector

A small point energy dispersive X-ray fluorescence (ED-XRF) spectrometer optimized for precious metal testing.

Authoritative standards for analysis of precious metal elements recognized by the market

Covering over 30 types of elements, with rich factory calibration, providing the best accuracy for trace and major component detection

Reduce measurement time by one-third: choose to obtain superior results with traditional measurement time or traditional results with superior testing time

The accuracy of elemental analysis is often crucial, especially when evaluating precious metals. For other applications, speed is even more important: high sample processing centers require fast and accurate analysis. In addition, all users hope that the analyzer is sturdy, convenient, and easy to operate, equipped with practical software, and the results can be easily transmitted to the laboratory network. When dealing with precious metals, users naturally appreciate non-destructive sampling.

For many years, SPECTRO MIDEX has provided ultra reliable top-level XRF performance in all of these fields. It is the industry standard for many analytical laboratories around the world. The sensitivity of the current fifth generation SPECTRO MIDEX analyzer has doubled compared to the previous generation product, with accuracy close to fire assay, while speed and ease of use far exceed the latter. It has been fully optimized for precious metal applications.

The compact new SPECTRO MIDEX analyzer integrates the latest developments in ED-XRF detector technology, using high counting rates and high resolution. These intelligent innovations make it one of the most advanced intermediate laboratory XRF desktop analyzers available in the field of precious metal testing. Therefore, customers can choose to significantly improve accuracy, even for small or trace element contents; Or significantly accelerate the testing speed to meet the demand for large sample processing volumes.