High temperature conductive material resistivity testing system

HTRC-600 High Temperature Conductive Material Resistance Testing System

HTRC-600High temperature conductive material resistivity testing system

Keywords: conductivity, resistivity, high temperature of 600 ℃, two probes, four probes

The HTRC-600 high-temperature conductive material resistivity testing system is a device specifically designed to measure the resistance and conductivity of materials. It uses a four terminal measurement method to test the resistivity system and a high-temperature test chamber as an integrated high-temperature testing system. It meets the measurement requirements of semiconductor and conductor materials for changes in resistance values due to temperature changes. By measuring the resistance and resistivity of conductive materials under high temperature, vacuum, and atmosphere conditions, it can analyze the curves of the resistance and resistivity of the tested sample as a function of temperature and time. Currently, it is mainly used to test samples such as discs, blocks, and strips, and can be widely used for resistivity measurement of carbon based conductive materials, metal based conductive materials, metal oxide based conductive materials, structural polymer conductive materials, composite conductive materials, and other materials. The measurement and control software can display the change curves of temperature and resistance, resistivity, and conductivity data.

1、 Main application scope:

1. Widely used for resistivity and conductivity measurement of carbon based conductive materials

2. Measurement of resistivity and conductivity of metal based conductive materials

3. Measurement of resistivity and conductivity of metal oxide based conductive materials

4. Measurement of electrical resistivity and conductivity of polymer conductive materials

5. Measurement of electrical resistivity of composite conductive materials and other materials

6. Can measure the resistivity of silicon and germanium single crystals (rods, chips)

7. Compliant with standards: ASTM B193-02 andGBT 6146-2010、GBT15662-1995

8. Main features of the product:

1. The high-temperature two probe fixture is used in conjunction with a lifting high-temperature testing platform to form a high-temperature two probe testing platform;

The thermocouple probe for temperature measurement and the sample platform are in the same heat sink, ensuring the consistency between the measured temperature and the sample temperature;

3. Adopting a compact design, with a small volume, simple structure, easy operation, and convenience;

The 4 'insulation tray isolates the sample platform from the adjustment platform and overlaps with the high-temperature testing platform, providing ideal insulation and heat preservation effects;

5. The probe adjustment device has three-dimensional precise adjustment function, accurately positioning the position of the probe;

6. The probe adjustment device has a coarse adjustment function, effectively increasing the adjustment range of the probe;

7. The probe adjustment device has a probe pressure adjustment function to ensure good contact between the probe and the sample without damaging the sample;

8. The probe adopts a coaxial shielding layer design to reduce electromagnetic interference in measurement;

9. The probe electrode is made of platinum iridium alloy, which effectively reduces contact resistance and has good high-temperature oxidation resistance;

10. Comes with calibration components, compatible with various testing instruments, and calibrates testing fixtures.

Main technical parameters:

1. Measurement temperature range: RT~600 ℃ or RT~800 ℃ or RT~1200 ℃ optional

2. Test probe: 2A high-temperature and high-frequency probe or4A high-frequency probe

3. Electrode diameter: 26.8mm

4. Sample size: Thickness less than 10mm, diameter 5-40mm

5. Temperature control methods: constant temperature, variable temperature, room temperature

6. Temperature control accuracy: ± 0.4 ℃

7. Electrical resistivity:10nΩ-10MΩ

8. Resistance:10nΩ-100MΩ

9. Conductivity:10-5～105 s/cm

10. Weight:38KG

11. Working temperature:5℃ to40℃

12. Weight:15KG

13. Can be used with any model Agilent, WayneKer r, So lar tron, Tonghui, Keysight

Seamless integration of LCR table

14. The equipment can cooperateZJ-3Type andZJ-6Type piezoelectric tester for piezoelectric testingD33Coefficient measurement