Hitachi UV-VIS-NIR UV/Vis/NIR spectrophotometer UH4150

characteristic:

Switching detector wavelengths can generate small signal differences, but even with UH4150, high-precision measurements can still be achieved.

Multiple detectors installed on the integrating sphere can measure in the wavelength range of ultraviolet visible near-infrared. Due to the use of Hitachi's professional integrating sphere structure technology and signal processing technology, the changes in absorbance values during detector switching (differences in signal levels) are minimized.

Hitachi's high-performance prism grating dual monochromator system can achieve low stray light and low polarization.

UH4150 adopts a prism grating (P-G) dual monochromator optical system, adhering to the characteristics of the U-4100 optical system. Compared with common grating grating (G-G) systems, the prism grating (P-G) system does not show significant changes in the intensity of S and P polarized light. Even for samples with low transmittance and reflectivity, UH4150 can achieve low-noise measurements.

Parallel beams can achieve precise measurement of reflected and scattered light.

The angle of incidence is crucial for determining the specular reflectance of solid samples. For converging light beams, the simulated design values of optical thin films such as conductive multilayer films and prisms will differ from the actual measured values due to factors such as the focal length of the lens that affect the incident angle.

But for parallel beams, the incident angle relative to the sample is always the same, achieving high-precision measurement of specular reflectance. In addition, parallel beams can be used for evaluating diffusion rate (haze) and measuring lens transmittance.

Multiple detectors suitable for different measurement purposes can be provided.

Eight different materials, sizes, and shapes of integrating spheres can be used. *2*3

Adopting a brand new ergonomic design.

Improve the sample room door and enhance operability. In order to facilitate the replacement of samples and accessories, an ergonomic design has been adopted.

Compatible with multiple U-4100 attachments.

The universal attachment is applicable to two models. The U-4100 attachment can also be used on UH4150 * 4 due to its detachable nature, making it suitable for a wider range of measurement types.

Higher sample flux than U-4100 model.

While adhering to the high performance of the U-4100 optical system, UH4150 provides higher throughput measurements. When measuring with a data interval of 1 nm, the scanning speed of the previous model of instrument must be 600 mm/min. The UH4150 model can be measured at intervals of 1 nm at a scanning speed of 1200 nm/min, significantly reducing the measurement time. *5UH4150 can be measured from 240 nm to 2600 nm in about 2 minutes. It is particularly effective for samples that need to be measured in the ultraviolet visible near-infrared wavelength range, such as solar reflective materials.

System product line:

Integral ball detection system

Various 60mm integrating balls can be used. Optional accessories: 150mm integrating sphere or angle continuously variable absolute reflection attachment (listed here are 60mm standard integrating spheres).

Direct light detection system

The direct light detector is built into the spectrophotometer. Provide other optional detectors to replace the direct light detector, such as various integrating spheres and angle continuously variable absolute reflection attachments.

specifications