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Guangzhou Yide Precision Scientific Instrument Co., Ltd
Hitachi desktop electron microscope TM4000/TM4000Plus
NegotiableUpdate on 07/10
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Overview
The unique low vacuum system of Hitachi TM4000 scanning electron microscope enables rapid observation of samples without any processing. TM4000 optimization provides observation modes at three different voltages: 5kV, 10kV, and 15kV. Each mode has four adjustable current levels and is equipped with a four segment backscatter detector, which can capture image information from four different directions and image the sample in multiple modes.
Product Details
Hitachi Desktop Electron Microscope Product Introduction：
The unique low vacuum system of Hitachi TM4000 scanning electron microscope enables rapid observation of samples without any processing. TM4000 optimization provides observation modes at three different voltages: 5kV, 10kV, and 15kV. Each mode has four adjustable current levels and is equipped with a four segment backscatter detector, which can capture image information from four different directions and image the sample in multiple modes. It has a brand new SEM-MAP navigation function, and at the same time, electron microscope images can be exported in the form of reports. Equipped with a large sample compartment, it can accommodate a maximum sample diameter of 80mm and a thickness of 50mm.
The TM4000Plus adds a high-sensitivity low vacuum secondary electronic probe UVD based on the TM4000, which has excellent imaging quality in low vacuum environments. TM4000Plus can superimpose secondary electron images and backscattered electron images and display them in real-time, obtaining the most sample information. The optional accessories are abundant and have many additional functions.
Parameters：
1. Observation conditions: 5kV/10kV/15kV (all four levels adjustable) EDX
2. Magnification: 10 ×~100000 ×
3. Observation mode: conductor (TM4000Plus), standard mode, elimination of charge mode
4. Detector: 4-section backscatter detector, low vacuum secondary electron detector (TM4000Plus)
Service scope:
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Test project Test Item |
Service scope Scope |
Microscopic morphology observation |
Observe and analyze the designated area and morphology of the sample according to customer requirements, with a magnification factor of less than10,000Double; Cannot test liquids and volatile substances |
elemental analysis |
measuring range/accuracy: Li3~Cf98 Scope of application: polymers, metals, inorganic substances, powders, etc; Qualitative and semi quantitative; Cannot test liquids and volatile substances |
Sectional analysis |
1. Observe the fractured sample using an optical microscope and scanning electron microscope 2. Mainly determine the mode of fracture(Resilience and brittleness)Source of crack, direction of extension, etc 3. The report includes fracture images and analysis results, but cannot determine the cause of the fracture |
Foreign object failure analysis |
Analysis of Metal Corrosion Products Qualitative analysis of precipitates in metal coatings Analysis of foreign substances in medium pollution |
Qualitative analysis of coating thickness and composition |
Regarding partial vacuum electroplating0.8μmThe thickness of the coating is as follows:SEMThickness testing, with a maximum resolution of up to0.01μm; and multi-layer coating line scanning composition analysis |
application area：
life sciences
material science
chemistry
Electronic Manufacturing
food industry
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