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Phone
13162829387
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Address
Room 2303, Guoke Building, Building 1, Lane 1029, Kongjiang Road, Shanghai
Shanghai Lunjie Electromechanical Instrument Co., Ltd
13162829387
Room 2303, Guoke Building, Building 1, Lane 1029, Kongjiang Road, Shanghai
JB-300WType microcomputer controlled impact testing machine
■ Product Description:JB-300WThe pendulum type microcomputer controlled impact testing machine is used to measure the resistance of metal materials to impact under dynamic loads, in order to determine the quality condition of materials under dynamic loads. This machine is a semi-automatic control testing machine with simple operation and high work efficiency. It is controlled by swing, impact, and release devices, and can automatically swing and prepare for the next experiment using the remaining energy after punching the sample. It is particularly suitable for laboratories that conduct continuous impact experiments and industries such as metallurgy and mechanical manufacturing that conduct a large number of impact experiments.
■JB-300WThe impact testing machine meets the national standardGB/T3808-2002Inspection of pendulum impact testing machine according to national standardsGB/T229-1994The "Method for Impact Test of Metallic Materials with Specific Notch" conducts impact tests on metallic materials.
■ Performance characteristics:This testing machine is operated by a microcomputer controlled testing machine. The computer detects the return to zero energy loss and swing cycle of the host, and can also display, store, and print test results. The testing machine is easy to operate and has high work efficiency. After punching the sample, it uses the remaining energy to automatically swing and prepare for the next impact test. Therefore, its superiority can be better demonstrated in laboratories that continuously conduct impact tests and metallurgical and mechanical manufacturing plants that conduct a large number of impact tests.
Main technical indicators:
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PRODUCT MODEL |
JB-300W |
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Impact energy |
150J、300J |
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Pre swing angle of pendulum |
150° |
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Distance from the center of the pendulum axis to the impact point |
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impact velocity |
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Sample support span |
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Jaw rounded corners |
R1 |
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Impact blade rounded corner |
R2 |
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Thickness of impact knife |
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Cooling method |
Semiconductor refrigeration |
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Sample box capacity |
20individual |
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Low temperature range |
0— |
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precision |
fluctuate±1.5℃ |
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power supply |
380V±10% 50HZ |
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environmental condition |
There is no corrosive medium, no vibration, and no strong electromagnetic field interference in the surrounding environment. |