Material high and low temperature resistivity tester (-160 ℃ -600 ℃)

NegotiableUpdate on 03/18

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Description: The HTIM-3 high and low temperature material resistivity tester is mainly used for evaluating and testing the conductivity of semiconductor materials. The system is designed and developed using the four wire resistance measurement principle, and can measure the resistance and resistivity of semiconductor materials under high temperature and vacuum atmosphere conditions. It can analyze the curves of the resistance and resistivity of the tested sample as a function of temperature and time. At present, testing is mainly conducted on samples such as wafers, blocks, and strips, which can be widely used for semiconductor materials such as silicon (Si) and germanium (Ge), compound semiconductor materials such as gallium arsenide (GaAs) and indium antimonide (InSb), and ternary compound semiconductor GaAsA

Product Details

HTIM-300High and low temperature material resistivity tester

High and low temperature testing platform

6517BHigh resistance tester

2450Low resistance meter

HTIM-3High and low temperature material resistivity testerMainly used for evaluating and testing the conductivity of semiconductor materials, this system is designed and developed using the four wire resistance measurement principle. It can measure the resistance and resistivity of semiconductor materials under high temperature and vacuum atmosphere conditions, and analyze the curves of the resistance and resistivity of the tested sample as a function of temperature and time. At present, testing is mainly conducted on test samples such as wafers, blocks, and strips, which can be widely used in semiconductor materials such as silicon（si）Germanium（ge）,Compound semiconductor material gallium arsenide(GaAs)Indium antimonide（InSb）Ternary compound semiconductorGaAsAl、GaAsPSolid solution semiconductors, such asGe-Si、GaAs-GaPMeasurement of resistivity of bulk materials and other materials.

Main application areas:

Semiconductor material resistance testing

Composite insulation materials

ceramic materials

muscovite

GLASS

Conductive functional thin film materials

Insulating metamaterial

Silicone rubber material

PCB material
1、 Main technical parameters:
Temperature range:-160℃-600℃
Heating slope:0-10℃/min (Typical values:3℃/min)
Temperature control accuracy: ±0.5℃
Resistance measurement range:0.1mΩ~1MΩ
Range of resistivity measurement:100nΩ..cm~100KΩ.cm
Measurement environment: inert atmosphere, reducing atmosphere, vacuum atmosphere
Measurement method: Four wire resistance method
Test channel: Single channel
Sample size:10mmx10mmX20mmOr φ ＜20mm , d＜5mm
Electrode material: Copper plated with gold
Insulation material:99Alumina ceramics
Data storage format:TXTText Format
Data transmission:USB
Compliant with standards:ASTM
Power supply:220V±10%，50Hz
Working temperature:5℃ to+ 40℃；
Storage temperature: -40 ℃ to +65 ℃
Working humidity:+40 At ℃, the relative humidity is as high as95%(No condensation)
Equipment size:400x450x580mm
Weight:38kg