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Phone
13472768389
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Address
Room 1046, 298 Kangqiao East Road, Pudong New Area, Shanghai
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Shanghai Maomo Scientific Instrument Co., Ltd
Park NX12 Atomic Force Microscope
NegotiableUpdate on 04/20
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Overview
-Atomic force microscopy (AFM) has the ability to capture images with nanoscale resolution and measure electrical, magnetic, thermal, and mechanical properties- The nanotube scanning system can be used for high-resolution scanning ion conductivity microscopy (SICM)- Inverted optical microscope (IOM) facilitates the integration of transparent material research and fluorescence microscopy.
Product Details
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Park NX12 can be used for any project,The numerous scanning modes and modular design of the NX series make it easy to adapt to the needs of any scanning probe microscope.
Standard imaging:
- True non-contact mode AFM
- Contact Mode AFM
- Lateral Force Microscopy (LFM)
- phase imaging
- Tap type AAFM
Electrical performance:
- Conductive AFM
- I-V spectral lines
- Scanning Kelvin Probe Microscope (SKPM/KPM)
- High voltage SKPM
- Scanning capacitance microscope (SCM)
- Scanning Resistance Microscopy (SSRM)
- Scanning tunneling microscope (STM)
- Scanning Tunnel Spectroscopy (STS)
- Time resolved photocurrent mapping (Tr PCM)
Magnetic properties:
- Magnetic force microscope (MFM)
- Adjustable external magnetic field MFM
Chemical properties:
- Scanning electrochemical cell microscope (SECCM)
- Scanning Electrochemical Microscopy (SECM)
- Electrochemical microscopes (EC-STM and EC-AFM)
- Chemical force microscope with functionalized probes
Thermal performance:
- Scanning Thermal Microscopy (SThM)
Optical performance:
- Probe enhanced Raman spectroscopy (TERS)
- Time resolved photocurrent mapping (Tr PCM)
Dielectric/piezoelectric properties:
- Electrostatic force microscope (EFM)
- Dynamic contact electrostatic force microscope (DC-EFM)
- Piezoelectric force microscope (PFM)
- High voltage PFM
Mechanical properties
- Pinpoint Nanomechanical Mapping
- Force Modulation Microscopy (FMM)
- nanoindentation
- Nanolithography
- High voltage nanoetching
- nanomanipulation
- Piezoelectric force microscope (PFM)
Force measurement:
- Force Distance (F-D) Spectroscopy
- Force volume imaging
- Calibration of elasticity coefficient using thermal noise method
atomic force microscope atomic force microscope
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