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Phone
13472768389
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Address
Room 1046, 298 Kangqiao East Road, Pudong New Area, Shanghai
Product Categories
Shanghai Maomo Scientific Instrument Co., Ltd
Park XE7 Atomic Force Microscope
NegotiableUpdate on 04/20
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Overview
Among the same level products, Park XE7 can bring measurement effects with Z-high nanometer resolution. Thanks to the atomic force microscope architecture of *, which includes independent XY and Z-axis flexible scanners, XE7 is able to achieve smooth, orthogonal, and linear scanning measurements, enabling precise imaging and measurement of sample features. In addition, Park's True Non Contact mode can also bring you * image effects, and the probe can maintain the resolution of the image even after multiple scans.
Product Details
| Origin category | Import |
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Technical Parameter
XY scanner:
- Closed loop control single module flexible XY scanner.
- Scanning range: 50 μ m × 50 μ m (optional 100 μ m × 100 μ m, 10 μ m × 10 μ m)
Z scanner:
- Flexible guided high-intensity scanner
- Scanning range: 12 μ m (optional 25 μ m)
Sample stand:
- XY table working range: 13 × 13 mm
- Z-platform work scope: 29.5 mm
- Scope of work for the focusing table: 70 mm
Optical system:
- Direct view coaxial optical system for observable samples and probes
- 10X objective lens (optional 20X)
- Field of view: 480 × 360 μm
- CCD: 1M pixels (pixel resolution: 0.4 μm）
Circuit system:
- High performance DSP: 600 MHz with 4800 MIPS
- Large image size: 4096 x 4096 pixels, 16 data images
- Signal input: 20 channels of 16 bit ADC during 500kHz sampling
- Signal output: 21 channels of 16 bit ADC during 500kHz sampling
- Synchronization signal: TTL signal for image end, line end, and pixel end
- Active Q control (optional)
- Elastic constant calibration of cantilever beam (optional)
- CE Compliant
- Power supply: 120 W
- Signal processing module (optional)
atomic force microscope atomic force microscope
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