SNE-4500 desktop scanning electron microscope SEM

NegotiableUpdate on 02/15

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Brief description: Desktop scanning electron microscope SEMA: Z large magnification 100000 times B: high depth of field, strong stereoscopic effect, high resolution C: stage five axis control system (tilt function), XY（40MM），R（360），TILT（0-45），Z（0-35MM）D： Equipped with four levels of variable aperture (30,50100200 μ m), high-resolution images can be provided by adjusting the electron beam size. E: autofocus, automatic adjustment of contrast and brightness, adjustment of e-book size, and anti astigmatism. F: The sample chamber is large and can be used for a variety of sample sorting

Product Details

SNE-4500GDesktop scanning electron microscope SEM

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A. Technical parameters
1. Resolution: 5nm (30kV, SE Image)
2. Magnification ratio: 30x~100000x (effective magnification ratio 60000x)
3. Acceleration voltage:
5kV to 30kV (5Kv/10Kv/15kV/20kV/30Kv-5 step)
4. Image:
Secondary Electron Image (SEI) - Secondary Electron Image
5. Observation mode: Standard Mode
6. Electronic gun system:
Filament type: pre aligned tungsten filament
Bias system: automatic bias mode
Electronic gun calibration: manual mode
7. Lens composition
i. Focusing lens: 2-stage magnetic coil lens
Ii. Objective lens: 1-segment magnetic coil lens
8. Detector type
E-T Detector
9. Stage system: 5-axis control
- X, Y-axis : 40mm / R-axis : 360°
- Z : 0~35mm / Tilt-axis : 0~45°
10. Image shift: X, Y Image Shift (100?)
11. Sample size:
80mm in diameter, 35mm in height

SNE-4500GDesktop scanning electron microscope SEM

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