Semiconductor HAST High Pressure Steaming Furnace Test Chamber

Semiconductor HAST High Pressure Steaming Furnace Test ChamberIt was developed to replace traditional Temperature Humidity Bias (THB) and Pressure Cooker Test (PCT) tests. The THB testing time is too long (usually 1000 hours), while the humidity of PCT is 100% RH (condensate), which differs from the actual environment. HASTBy increasing pressure (usually2-3To allow for pressure exceeding one atmosphere100°CMaintaining high humidity at a certain temperature (usually85%RH）And it does not produce condensation. This greatly accelerates the penetration rate of water vapor into the interior of the package, thereby enabling it to penetrate in a short period of time (e.g96 Simulate the effects of a humid environment for several years in hours.

Semiconductor HAST High Pressure Steaming Furnace Test Chamber

1. Adopting an imported high-temperature resistant solenoid valve dual circuit structure greatly reduces the failure rate during use.

2. Independent steam generation chamber to avoid direct steam impact on the product and prevent local damage to the product.

3. The door lock has a labor-saving structure, which solves the problem of difficult locking of the original product's disc-shaped handle.

4. Test the front row cold air; Exhaust cold air during the experimentdesignImprove pressure stability and reproducibility by releasing air from the test bucket

5.Ultra long experimental operation time, long-term operation of the experimental machine400 hours

6. Water level protection, through the laboratorywater levelSensor detection protection

7. Tank pressure resistant design, box body pressure resistant (150)℃)2.65kg， Meets the water pressure test of 6kg

8. Two stage pressure safety protection device, using a combination of two-stage controller and mechanical pressure protection device

9. Safety protection pressure relief button, emergency safety device two-stage automatic pressure relief button

safeguard:

a. High temperature resistant sealed solenoid valve adopts a dual circuit structure to ensure no pressure leakage.

b. The whole machine is equipped with multiple safety devices including overpressure protection, overtemperature protection, one key pressure relief, and manual pressure relief,

To ensure the use and safety of users to a large extent.

c. The anti pressure door lock device prevents the test chamber door from opening when there is pressure inside the laboratory