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Phone
1316612105513817307074
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Address
Building A, Cangyuan Science and Technology Park, 951 Jianchuan Road, Minhang District, Shanghai
Shanghai Baihe Instrument Technology Co., Ltd
1316612105513817307074
Building A, Cangyuan Science and Technology Park, 951 Jianchuan Road, Minhang District, Shanghai
X-ray crystal flaw detectorMainly used for studying the internal microstructure of materials. For example, single crystal orientation, defect inspection, material characterization, determination of lattice parameters, determination of residual stress, etc.
X-ray crystal flaw detectorTechnical parameters:
1Tube voltage:10~60KVAutomatically controlled by a microcontroller(1KV/step);
2Tube current:5~80mAAutomatically controlled by a microcontroller(1mA/step)Stability of tube voltage and tube current ≤0.3‰
3Rated output power:3KW
Whether there is pressure, no current, overvoltage, overcurrent, over power, no waterXLight tube over temperature protection.
4Cooling device:
Equipped with a built-in refrigeration system, there is no need for external water circulation, and the water temperature and display are automatically controlledXLight tube temperature.
5Protective cover: The external radiation measurement shall not exceed2.5μSv/h
6、XLight tube: rated power2KW(Copper target)
7Timing: The microcontroller automatically sets the timing, allowing for arbitrary selection of the timing time.