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Shanghai Baihe Instrument Technology Co., Ltd
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Shanghai Baihe Instrument Technology Co., Ltd

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    1316612105513817307074

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    Building A, Cangyuan Science and Technology Park, 951 Jianchuan Road, Minhang District, Shanghai

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X-ray crystal flaw detector

NegotiableUpdate on 02/16
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Overview

Product Code: DDAL-2523 Product Model: DDAL-2523 Category: Non destructive testing equipment - X-ray testing equipment (RT) Brand: BAHENS Shanghai Baihe Application: Non destructive testing Application: Metal Production Unit: The X-ray crystal flaw detector is mainly used to study the internal microstructure of materials. For example: single crystal orientation, inspection

Product Details

X-ray crystal flaw detectorMainly used for studying the internal microstructure of materials. For example, single crystal orientation, defect inspection, material characterization, determination of lattice parameters, determination of residual stress, etc.

X-ray crystal flaw detectorTechnical parameters:

1Tube voltage:1060KVAutomatically controlled by a microcontroller(1KV/step)

2Tube current:580mAAutomatically controlled by a microcontroller(1mA/step)Stability of tube voltage and tube current ≤0.3

3Rated output power:3KW

Whether there is pressure, no current, overvoltage, overcurrent, over power, no waterXLight tube over temperature protection.

4Cooling device:

Equipped with a built-in refrigeration system, there is no need for external water circulation, and the water temperature and display are automatically controlledXLight tube temperature.

5Protective cover: The external radiation measurement shall not exceed2.5μSv/h

6XLight tube: rated power2KW(Copper target)

7Timing: The microcontroller automatically sets the timing, allowing for arbitrary selection of the timing time.