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1316612105513817307074
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Address
Building A, Cangyuan Science and Technology Park, 951 Jianchuan Road, Minhang District, Shanghai
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- Non destructive testing instrument - phased array testing instrument
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Shanghai Baihe Instrument Technology Co., Ltd
X-ray flaw detector (directional)
NegotiableUpdate on 02/16
- Model
- Nature of the Manufacturer
- Producers
- Product Category
- Place of Origin
Overview
Product Code: XXQ-2005 Product Model: XXQ-2005 Type Category: Non destructive testing equipment - X-ray testing equipment (RT) Brand: BAHENS Shanghai Baihe Application: Non destructive testing Application: Metal Production Unit: X-ray flaw detector (directional) XXQ-2005 focal length 600 mm, exposure time 5 minutes, double-sided lead foil increased
Product Details
XX-ray flaw detector(Orientation)XXQ-2005Technical parameters of the model
1Output voltage:100～200KV, continuously adjustable
2Tube current:5mA
3Focus size:1.5×1.5mm
4Radiation angle 40＋5°
5Focal length600 mm ,time of exposure5minDouble sided lead foil enhances sensitivity
6Sensitivity:1.5％
7Film density:D＞1.5
8Maximum penetration power:30mm(A3steel)
