ZSX Primus III+Wavelength Dispersive X-ray Fluorescence Spectrometer

The X-ray tube is located above the analyzed sample, minimizing the risk of powder scattering and damaging the light tube in the vacuum chamber, and eliminating the need for adhesives during powder sample analysis, making sample preparation faster and easier.
The vacuum pumping and unloading rates can be directly switched between slow and fast to achieve optimal sample processing capacity for powder and metal samples.

characteristic

• Realize high-precision analysis of different elements and contents in powder and solid samples

• High precision positioning sample stage meets the high-precision requirements of alloy analysis

• Special optical system reduces errors caused by uneven sample surfaces

• The sample room can be easily removed for easy cleaning

• The operation interface is simple and highly automated

ZSX Primus III +

Rigaku ZSX Primus III+rapidly quantifies primary and secondary atomic elements from oxygen (O) to uranium (U) in various sample types with minimal standards.

Pipelines with higher reliability than optical components

The ZSX Primus III+features innovative optical configurations as described above. Due to the maintenance of the sample room, there is no longer a need to worry about contaminated beam paths or downtime. The geometric structure above the optical components eliminates cleaning issues and extends usage time.

High precision sample positioning

The high-precision positioning of the sample ensures that the distance between the sample surface and the X-ray tube remains constant. This is important for applications that require high precision, such as alloy analysis. ZSX Primus III+adopts a unique optical configuration for high-precision analysis, aiming to minimize errors caused by non flat surfaces in the sample, such as molten beads and pressed particles

Basic parameters of SQX using EZ scan software

EZ scanning allows users to analyze unknown samples without prior configuration. The time-saving feature only requires a few clicks of the mouse and entering the sample name. Combined with SQX basic parameter software, it can provide the most accurate and fastest XRF results. SQX can automatically correct all matrix effects, including line overlap. SQX can also correct the secondary excitation effects of photoelectrons (light and ultra light elements), different atmospheres, impurities, and different sample sizes. Using a matching library and a perfect scanning analysis program can improve accuracy.

characteristic

• Analysis of Elements from O to U

• The optical components above the pipeline minimize pollution issues

• Small footprint, limited laboratory space used

• High precision sample positioning

• Special optical components can reduce errors caused by curved sample surfaces

• Statistical Process Control Software Tool (SPC)

• Throughput can optimize evacuation and vacuum leak rates