15 ℃/min rapid temperature change test box 225L high and low temperature rapid switching limit aging test

NegotiableUpdate on 06/23

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Rapid temperature change of 15 degrees per minute, suitable for conducting rapid temperature rise and fall experiments, extreme testing, product heat and cold resistance, and performance under alternating cold and hot conditions.

Product Details

15 ℃/min rapid temperature change test box 225L high and low temperature rapid switching limit aging test

1、 Product Overview:

This device is suitable for schools, factories, military industries, research institutions, laboratories, universities, and other units to test the performance indicators, storage, and adaptability of various electronic components in high temperature, low temperature, or alternating high and low temperature environments.

2、 Technical parameters:

model/Name	HXKB-225L-15 Rapid Temperature Change Test Chamber
temperature range	-70℃~200℃
cooling rate	-60-100 ℃, 15 ℃/min 100~180 ℃, ≥ 5 ℃/minute
heating rate	100 ^ -60 ℃, ≤ 15 ℃/minute 180~100 ℃, ≤ 5 ℃/minute
temperature fluctuation	±0.5℃
Inner container size	600 * 500 * 750mm (width * depth * height)
External dimensions	1200 * 1500 * 1850 (width * depth * height)
Cooling method	water-cooling
voltage	380V/50Hz three-phase five wire system
control system	fully automaticPLC intelligent control, 7-inch color touch screen, real-time temperature feedback

3、 Box structure:

lThe box has a beautiful and elegant shape, processed by CNC machine tools, and adopts non reactive handles for easy operation.

lThe inner liner of the box is made of high-grade stainless steel（SUS304 mirror panel, the box body is made of cold-rolled steel plate electrostatically sprayed, which increases the appearance texture and cleanliness.

lThe large observation window is equipped with lighting to keep the inside of the box bright, and uses tempered glass embedded in the heating body to observe the condition inside the box clearly at any time. There is a test hole on the left side of the box, which can be used for external testing power or signal lines.(The aperture or number of holes must be specified when placing the order). The bottom of the machine adopts high-quality fixed PU movable wheels.

4、 Control system:

l7-inch programmable color touch controller.

lAdopting a large touch screen mode for screen display, simple screen operation, and easy program editing.

lThe controller operation interface is available in both Chinese and English, and the operating curve chart can be displayed on the screen.

lhaveThe capacity of 100 sets of programs with 1000 segments of 999 loop steps, and the set time value for each segment is 99 hours and 59 minutes.

lAfter inputting the data and experimental conditions, the controller has a screen lock function to prevent manual touch and shutdown.

lhaveThe PID automatic calculation function can immediately correct temperature change conditions, making temperature control more accurate and stable.

lhaveRS-232 or RS-485 communication interface, can be programmed on a computer, monitor the testing process, and perform power on/off functions.

lCan connect to a printer or485 communication interface, computer display and printing of temperature and time curves, providing strong guarantee for storing and replaying experimental process data.

5、 Refrigeration system:

lThe refrigeration unit is made of original French equipmentTaikang fully enclosed compressor.

lThe refrigeration system adopts a single low-temperature circuit system design.

lAdopting a multi wing air supply fan for strong air circulation, avoiding any dead corners, can make the temperature and humidity distribution in the testing area uniform.

lThe design of wind path circulation for air outlet and return ensures that the wind pressure and speed meet the testing standards, and can quickly stabilize the temperature at the moment of opening the door.

lCompletely independent heating and cooling can improve efficiency, reduce testing costs, extend lifespan, and decrease failure rates.

6、 Compliant with standards:

lGB-2423.1-89 (IEC68-2-1) Test A: Low temperature test method.

lGB-2423.2-89 (IEC68-2-2) Test B: High temperature test method.

lGJB360.8-87 (MIL-STD-202F) High temperature life test.

lGBJ150.3 (MIL-STD-810D) High temperature test method.

lGJB150.4 (MIL-STD-810D) Low temperature test method.

lGB/T 2423.2-2008 Test B "High temperature test method"

lGB10586-89 Technical Conditions for Low Temperature Test Chamber

lGB/T10592-89 Technical conditions for high and low temperature test chambers

lGB10592-89 Technical Conditions for High and Low Temperature Test Chamber

lGB11158 Technical Conditions for High Temperature Test Chamber