AFM-SEM Atomic Force Scanning Electron Microscope Integrated Machine

AFM-SEM Atomic Force Scanning Electron Microscope Integrated Machine

The newly released AFM in Phenom XL combines the advantages of scanning electron microscopy (SEM) and atomic force microscopy (AFM) to achieve multimodal (SEM and AFM morphology, elemental, mechanical, electrical, magnetic) correlation analysis of samples in the same system.

·Device scanning range (open-loop): 100 μ m × 100 μ m × 20 μ m

·Device scanning range (closed loop): 80 μ m × 80 μ m × 16 μ m

·Resolution: 0.2nm × 0.2nm × 0.04nm

·Maximum sample size: 21mm × 11mm × 8mm

·Maximum sample weight: 100g

·Imaging modes: surface morphology and roughness, CAFM, KPFM, FMM, PFM, EFM, F-z curves, I-V curves, etc

Funa Electron Microscope - Funa Scientific Instruments (Shanghai) Co., Ltd., founded in Shanghai in 2012, provides desktop scanning electron microscopes for universities, enterprises, and research institutes. Its products include:Desktop field emission scanning electron microscope、 CeB6 filament series desktop scanning electron microscope, Particle X series fully automatic scanning electron microscope, and scanning electron microscope sample preparation equipment - ion grinder, etc.

Feina Electron Microscopy also provides technical support and testing services related to desktop scanning electron microscopy. We have been focusing on microscopy technology and committed to popularizing scanning electron microscopy. Feina Electron Microscopy provides advanced training for users from basic theories of scanning electron microscopy to Level 5 application engineers. Testing centers and after-sales service centers have been established in Shanghai, Beijing, Guangzhou, and Chengdu. Currently, Feina Electron Microscopy has over 2000 users in China.