Atomic Force Microscope (Environmental Control Type) FM Nanoview EC-AFM

◆Optical metallographyMicroscopeIntegrated design with atomic force microscope, powerful functionality

◆Simultaneously equipped with optical microscope and atomic force microscope imaging functions, both can work simultaneously without affecting each other

◆Can work simultaneously in ordinary air environment, liquid environment, temperature control environment, and inert gas control environment

◆The sample scanning table and laser detection head are designed in a closed manner, which can be filled with special gases inside without the need for an additional sealing cover
◆The laser detection adopts a vertical optical path design, which can work under liquid when combined with a gas-liquid dual-purpose probe holder
◆Single axis drive sample automatically approaches the probe vertically, scanning the needle tip perpendicular to the sample
◆Intelligent needle insertion method for motor controlled automatic detection of piezoelectric ceramics, protecting probes and samples

◆Ultra high magnification optical positioning system, achieving precise positioning of probe and sample scanning areas
◆Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%

technical parameter