Scanning tunneling microscope (teaching type) FM Nanoview T-STM

NegotiableUpdate on 02/05

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Scanning tunneling microscope (teaching type) FM Nanoview T-STM

Product Details

◆Small and detachable design, very easy to carry and classroom teaching

◆The detection head and sample scanning table are integrated into one, with a very stable structure and strong anti-interference ability
◆Single axis drive sample automatically approaches the probe vertically, scanning the needle tip perpendicular to the sample
◆Intelligent needle insertion method for motor controlled automatic detection of piezoelectric ceramics, protecting probes and samples
◆sideCCDObservation system, real-time observation of probe insertion status and positioning of probe sample scanning area
◆Spring suspension shock-absorbing method, simple and practical, with good shock-absorbing effect
◆Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%

technical parameter

Working mode	Constant high mode, constant current mode	Optical observation	1-500x magnification continuously adjustable
Current spectrum curve	I-V curve, current distance curve	Scanning rate	0.1Hz~62Hz
XY scanning range	5×5um	Scanning angle	0~360°
Z-scan range	1um	Operating environment	Windows XP/7/8/10 operating system
Scanning resolution	Horizontal 0.05nm, vertical 0.01nm	communication interface	USB2.0/3.0
Sample size	Φ≤68mm，H≤20mm	Shock absorption design	Spring suspension
Sample table itinerary	15×15mm

Application Cases

Graphite steps/Scanning range0.3µm×0.3µmHigh order graphite/Scanning range5nm×5nmGold cluster/Scanning range0.5µm×0.5µm