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E-mail
al@aolongcn.cn
- Phone
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Address
No. 66, Aihe Street, Zhenxing District, Dandong City, Liaoning Province
Dandong Aolong Radiation Instrument Group Co., Ltd
al@aolongcn.cn
No. 66, Aihe Street, Zhenxing District, Dandong City, Liaoning Province

one、 Basic Equipment Description
Brand new high-endThe AL-Y3500 X-ray diffractometer is a high-performance and high-precision domestically produced X-ray diffractometer in China. It is a project launched by the National Development and Reform Commission. The instrument adopts advanced core technology and can accurately perform phase qualitative and quantitative analysis on metal and non-metal polycrystalline samples. It is mainly used for phase qualitative or quantitative analysis of samples, crystal structure analysis, material structure analysis, macroscopic or microscopic stress determination, crystal size determination, crystal size determination, crystallinity determination, etc. Therefore, it has wide applications in many disciplines and industries such as materials science, physics, chemistry, metallurgy, minerals, pharmaceuticals, building materials, ceramics, etc.
Can accurately perform qualitative, quantitative, and crystal structure analysis on both metallic and non-metallic samples.After configuring the corresponding attachments, they can be further used to study the effects of high and low temperatures on material structures; Structural analysis of thin film samples, metal material texture, stress measurement, etc.
The instrument should be manufactured using the most advanced technology currently available, and the angle measurement accuracy and precision of the goniometer should reach the world's advanced level. The light source and detector can work stably for a long time, ensuring accurate and precise measurement of diffraction peak position, peak shape, and intensity. Conduct phase structure analysis, including phase content, grain size determination, crystallinity, austenite content, crystal cell determination, type II stress calculation, diffraction line indexing, phase structure analysis, etc; Thin film material analysis, small angle particle size analysis, etc. The instrument includes high stabilityX-ray generator, high-precision angle measuring instrumentflickerDetector (or one-dimensional detector), data processing software, related application software, etc.
two、 Instrument Features
● high stabilityX-ray source: The instrument uses a solid-state X-ray generator, which greatly improves the stability of the diffraction instrument measurement results;
● long lifespanX-ray tube: Metal ceramic X-ray tube with good heat dissipation and high operating power (40kV × 40mA)(50kV×40mA)Long service life characteristics;
● High precision angle measuring instrument: diffraction angle drive adoptsstepmotor drive+Optical coding control technology, with accurate positioning and high measurement accuracy; The concealed design of the angle measuring instrument makes the instrument appear more neat, beautiful, and elegant; Within the measurement range of diffraction angle, the linearity of diffraction angle is less than 0.02 °;
