Desktop X-ray diffractometer

Desktop X-ray diffractometer

Designed for industrial production and quality control, the advanced technology of concentrated X-ray diffractometer production, functional and miniaturized desktop X-ray diffractometer. Can accurately perform qualitative analysis, quantitative analysis, and crystal structure analysis on metal and non-metal samples. Especially suitable for the manufacturing industries of catalysts, titanium dioxide, cement, pharmaceuticals and other products.

Main technical indicators:

Operating power (tube voltage, tube current): 600W (40kV, 15mA) or 1200W (40kV, 30mA), stability: 0.005%

X-ray tube: metal ceramic X-ray tube, Cu target, power 2.4kW, focal size: 1x10 mm

Air cooling or water cooling (water flow rate greater than 2.5L/min)

● Goniometer: Sample horizontal θ s - θ d structure, diffraction circle radius 150mm

Sample measurement methods: continuous, stepwise Omg

● Angle measurement range: -3 ° -150 ° for θ s/θ d linkage

Minimum step width: 0.0001 °

● Angle reproduction: 0.0005 °

● Angular positioning speed: 1500 °/min

Counter: Closed proportional or high-speed one-dimensional semiconductor counter

Spectral resolution: less than 25%

Maximum linear count rate: ≥ 5 × 105CPS (proportional), ≥ 9 × 107CPS (one-dimensional semiconductor)

● Computer: Dell Commercial Notebook

Instrument control software: Windows 7 operating system, automatically controls the tube voltage, tube current, shutter, and tube aging training of the X-ray generator; Control the angle measuring instrument to perform continuous or stepwise scanning, while also collecting diffraction data; Conventional processing of diffraction data: automatic peak searching, manual peak searching, integrated intensity, peak height, center of gravity, background subtraction, smoothing, peak shape amplification, spectral comparison, etc.

Data processing software: phase qualitative and quantitative analysis, K α 1 and α 2 stripping, full spectrum fitting, peak selection fitting, full width at half maximum and grain size calculation, unit cell determination, second-class stress calculation, diffraction line indexing, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, standard free quantitative analysis and other functions, full spectrum fitting (WPF), XRD diffraction spectrum simulation.

● Scattered radiation protection: lead+lead glass protection, interlocking of light gate window and protective device, scattered radiation measurement not exceeding 1 μ Sv/h

● Comprehensive stability of the instrument: ≤ 1 ‰

● Sample loading data once: Configure a sample changer to load up to 6 samples at a time

● Instrument dimensions: 600 × 410 × 670 (w × d × h) mm