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Funa Scientific Instruments (Shanghai) Co., Ltd

  • E-mail

    cici.yang@phenom-china.com

  • Phone

    18516656178

  • Address

    Room T5705, Shanghai Hongqiao Libao Plaza, No. 88 Shenbin Road, Hongqiao Town, Minhang District, Shanghai

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Feina Electron Microscope Panoramic Puzzle

NegotiableUpdate on 01/05
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Overview

Feina Electron Microscope Panoramic Puzzle $r $n New Interface, One Click Scanning for More Convenient $r $n Scanning "Shape" Customization $r $n Large Sample Panoramic Observation $r $n High Definition Images with No Misalignment

Product Details


Feina Electron Microscope Panoramic Puzzle operating interface


飞纳电镜全景拼图【新品】





When the sample size observed by scanning electron microscopy is large and exceeds the minimum field of view of the electron microscope, the full picture of the sample cannot be seen, which is very unfriendly for some application fields that require obtaining the full picture of the sample. Based on high-precision motors, high brightness crystal filaments, and powerful image data processing capabilities, the Feina electron microscope has launched a panoramic puzzle software. This software can perform custom "shape" panoramic scanning on all samples within the optical field of view, obtaining a panoramic image of the sample and breaking free from the constraints of sample size.


Feina Electron Microscope Panoramic Puzzle The software is easy to operate and can be imaged with just one click. It is suitable for application scenarios that require obtaining the full picture of the sample. It is recommended to be used in the following fields:


• Crack propagation analysis


• Analysis of metal fracture surface


PCB Failure Analysis


• Observation of biological samples


• Imaging of large-sized samples, etc


The main advantages of the panoramic puzzle of the Feina electron microscope are:


The operating software is embedded in the electron microscope system for quick switching


New UI design, simple interface, efficient operation


The scanning area can be customized and only valuable areas can be scanned


Continuous adjustment of single image field of view range


High precision motor for more precise sample movement


• Large area, fast scanning


• Automatic stitching of images to eliminate image dislocations


• Auto focus, suitable for large depth of field samples


Specifications:


image mode


• backscattered electron image


• Secondary electronic images


Focus mode


autofocus


Main parameters


• Number of images


• Pixel size


• Magnification factor


• Scanning time


scanning method


The entire sample area can be scanned


Maximum 100mm x 100mm