Feina electron microscopy color imaging technology

Feina electron microscopy color imaging technologyChemiSEM， Combining SEM morphology observation with EDS composition analysis makes the workflow smoother and simplifies the analysis process of many materials, including metals, ceramics, batteries, coatings, cement, and soft materials. By real-time overlay of color element distribution maps and SEM images, high-quality qualitative and quantitative information on composition is provided during imaging.

Real time analysis to obtain deeper information. SEM-EDS analysis is inherently complex, and for applications such as product fault analysis and pollutant identification, research and development need to continuously improve quality control (QC) and fault analysis (FA) processes to better solve problems that arise. The real-time analysis of ChemiSEM technology provides advantages in quality control and production efficiency improvement. Its EDS is integrated into the instrument and always collects component data in the background during electron microscopy operation, gradually establishing more comprehensive and detailed information about the sample, helping you locate key quality issues faster. Real time quantitative surface scan: no longer available

Real time quantitative surface scan: There is no longer any interference from analysis in traditional element analysis. Complex sample element distribution and phase distribution surface scan cannot obtain accurate results in a timely manner. For example, a peak signal can sometimes be identified as two elements, causing errors and interfering with the determination of sample QC issues. With innovative algorithms and intelligent spectral fitting, ChemiSEM technology can help your laboratory team achieve accurate element identification and quantification - even when dealing with multiple overlapping elements.

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ChemiSEM quantitative surface scan:Feina electron microscopy color imaging technologyChemiSEM automatically processes raw signals and generates quantitative surface scan results. The data is well parsed, which can effectively avoid the influence of peaks and overlapping peaks. And the algorithm is used to simultaneously process BSE (backscattered electron) and EDS signals, so that the morphology and elemental quantification results of the sample can be displayed in real time.

Traditional phase analysis without bias heavily relies on assumptions about the sample, which can be a problem when elements are missed due to overlapping spectral peaks or insufficient intensity. With ChemiPhase (a new feature in ChemiSEM technology), this situation can be avoided. The analysis of complex samples can achieve zero bias and systematically identify each independent phase based on all spectral results in the data unit. Subsequently, data analysis can run automatically without any pre-defined elements, enabling the localization of minor/trace elements without the need for extensive experience, clearly identifying major and minor components, and completing more in-depth and comprehensive analysis.

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The analysis of geological sections using ChemiPhase automatically extracts and calculates the energy spectrum components of each phase, effectively distinguishing different mineral phases.

In the process of automatic sample drift correction component analysis, accurate and effective quantitative results require a correct and stable sample position information. Usually, in the case of image drift, researchers need to re obtain analysis data multiple times or wait for the sample to stop drifting before obtaining data, both of which will reduce testing efficiency. By continuously monitoring the sample position, ChemiSEM software provides automatic sample drift correction, making high magnification operations and longer energy spectrum collection possible. Help everyone save valuable time and energy, and focus on more important things: obtaining the highest quality data as soon as possible.