Olympus Tool Glue OLS5000

Olympus Tool Glue OLS5000

The LEXT OLS5000 3D measuring laser microscope is equipped with two sets of optical systems (color imaging optical system and laser confocal optical system), which enable it to obtain color information, height information, and high-resolution images.

[Obtain color information]

The color imaging optical system uses white LED light source and CMOS camera to obtain color information.

[Obtaining 3D height information and high-resolution confocal images]

The laser confocal optical system uses a 405 nanometer laser diode light source and a high-sensitivity photomultiplier tube to obtain confocal images. Shallow focal depth enables it to be used for measuring surface irregularities of samples.

405 nanometer laser light source

The lateral resolution of optical microscopes improves as the wavelength decreases. Compared to traditional microscopes using visible light (peak at 550 nanometers), laser microscopes using short wavelength lasers
Has better lateral resolution. The OLS5000 microscope utilizes a 405 nanometer short wavelength laser diode to achieve excellent lateral resolution.

Laser confocal optical system

The laser confocal optical system only receives light focused through a circular pinhole, and does not collect all light reflected and scattered from the sample. This helps eliminate ambiguity and enables it to obtain
Images with higher contrast than ordinary microscopes.

X-Y scanner

The Olympus tool glue OLS5000 microscope is equipped with an Olympus optical scanner. By comparing the X-axis of the electromagnetic induction MEMS resonant scanner with the

The combination of the Y-axis of Galvano scanning galvanometer allows the X-Y scanner to be positioned at a conjugate position relative to the objective pupil, thus achieving a lower scanning trajectory loss

Excellent X-Y scanning with true and small optical aberrations.

Principle of Height Measurement

When measuring height, the microscope obtains multiple confocal images by automatically moving the focal position.

Based on the discontinuous focal position (Z) and detection light intensity (I), the intensity variation curve (I-Z curve) of each pixel can be estimated, and its peak position and peak intensity can be obtained.

Due to the correspondence between the peak positions of all pixels and the irregularity of the sample surface, 3D shape information of the sample surface can be obtained. Similarly, peak intensity data can be used to

To obtain images (extended images) of all focal points on the surface of the sample.