X-ray diffractometer AL-Y3000

X-ray diffractometer AL-Y3000

AL-Y3000The Type 1 diffractometer is designed for material research and industrial product analysis, and is a comprehensive product that combines conventional analysis with special purpose measurement.

The perfect combination of hardware and software systems meets the needs of scholars and researchers in different application fields

High precision diffraction angle measurement system to obtain more accurate measurement results

● High stabilityXThe control system of the radiation generator achieves more stable repeated measurement accuracy

Programmed exploration, integrated structural design, easy operation, and more aesthetically pleasing instrument appearance

X-ray diffractometer is a universal testing instrument that reveals the crystal structure and chemical information of materials.

Identification of one or more phases in unknown samples

Quantitative analysis of known phases in mixed samples

● Crystal structure analysis

Texture and stress analysis of metal materials

X-ray diffractometer can analyze natural or artificially synthesized inorganic or organic materials, and is widely used in research fields such as clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock minerals, polymers, etc.

Based on θ - θ geometric optical design, it facilitates sample preparation and installation of various accessories

The application of metal ceramic X-ray tubes greatly improves the operating power of diffraction instruments

Closed proportional counter, durable and maintenance free

Silicon drift detectors have superior angular and energy resolution, with measurement speeds increased by more than three times

● Rich diffraction instrument accessories to meet the needs of different analysis purposes

Automatic recognition of various functional accessories of the diffractometer

Modular design, also known as plug and play components, allows operators to correctly use the corresponding accessories of the diffractometer without the need to calibrate the optical system