X-ray diffractometer AL-Y3500A

X-ray diffractometer AL-Y3500A

The AL-Y3500A diffractometer is designed for material research and industrial product analysis, and is a comprehensive product that combines conventional analysis with special purpose measurement.

The perfect combination of hardware and software systems meets the needs of scholars and researchers in different application fields.

• High precision diffraction angle measurement system for obtaining more accurate measurement results

• A highly stable X-ray generator control system achieves more stable repeated measurement accuracy

• Various functional accessories meet the needs of different testing purposes

• Programmed operation, integrated structural design, easy operation, and more aesthetically pleasing instrument appearance

  X-ray diffractometer is a universal testing instrument that reveals the crystal structure and chemical information of materials

• Identification of one or multiple phases in unknown samples

• Quantitative analysis of known phases in mixed samples

• Crystal Structure Analysis (Rietveld Structure Analysis)

• Crystal structure changes under unconventional conditions (high and low temperature conditions)

• Thin film sample analysis, including thin film phase, multilayer film thickness, surface roughness, and charge density

• Analysis of micro area samples

• Texture and stress analysis of metal materials