Fischer XAN220/222 X-ray fluorescence thickness gauge from Germany

Product description

FISHERSCOPE ® X-RAY XAN ® 220/222,X-ray fluorescence measuring instrument, used for rapid and non-destructive analysis of gold and silver alloys：

The X-ray fluorescence measuring instrument is used for rapid non-destructive analysis and coating thickness measurement of gold and silver alloys. The Fischer FISCHERSCOPE X-RAY XAN 220 is an optimized X-ray fluorescence measuring instrument used for non-destructive analysis of jewelry, coins, and precious metals. It is particularly suitable for analyzing the composition and coating thickness of precious metals and their alloys. Up to 24 elements can be simultaneously measured in the range of chlorine (17) to uranium (92). FISCHERSCOPE X-RAY XAN 220 and XAN 222 comply with DIN ISO 3497 and ASTM B568. Our company also operates imported new equipment from world-renowned brands such as Taylor Hobson from the UK, gearInspect Group from the Czech Republic, Helmut Fischer from Germany, EPK from Germany, InnovatTest from the Netherlands, TRIMOS from Switzerland, Olympus from the US, Raytek from the US, and roughness meters, cylindrical gear measuring instruments, coating thickness gauges, various hardness testers, height gauges, ultrasonic flaw detectors, DO-2 K PC bevel gear single-sided meshing measuring instruments, etc. Welcome to leave a message online or call for consultation!!

Product Features:

The Fisher XAN220 X-ray metal material analyzer is specially optimized for non-destructive analysis of jewelry, coins, and precious metals;
Equipped with fixed collimators and basic filters, especially suitable for precious metal analysis
Equipped with high-resolution silicon drift detector (SDD), suitable for more complex multi-element analysis

The measurement direction from bottom to top allows for easy sample positioning

Typical application areas include:

• Jewelry, precious metals, and dental alloys
Yellow white gold
Platinum and silver
• Rhodium
Alloy and coating analysis
Multi layer coating analysis

The characteristics of all Fischer X-ray systems are excellent accuracy and long-term stability. The necessity of recalibration is greatly reduced, saving time and effort. Modern silicon drift detectors have achieved high precision and good detection sensitivity. Fischer's basic parameter method allows for the analysis of solid and liquid samples as well as coating systems without calibration. Xan220 is a user-friendly desktop instrument. Sample positioning is fast and convenient. The X-ray source and semiconductor detector components are located at the bottom of the instrument, so the measurement direction starts from below the sample, which is supported by a transparent window.

intended use	Energy dispersive X-ray spectrometer (ED XRF) is used to analyze the composition and coating thickness of precious metals and their alloys.
Element Range	Sulfur S (16) to uranium U (92) - up to 24 elements simultaneously
repetitiveness	For gold ≤ 0.5 ‰, the measurement time is 60 seconds
setplan	Desktop unit with upward opening cover
measureQuantity direction	bottom-up
XX-ray tube	Micro focus tungsten tube with beryllium window
high voltage	3steps：30 kV，40 kV，50 kV; *High anode current: 1 mA
Aperture (collimator)）	Ø 1 mm (39 mils), 可选 Ø 2 mm (79 mils) or Ø 0.6 mm (23.6 mils)
measurement point	Ø 1.2 mm (47 mils) with aperture Ø 1 mm (39 mils)Flat sample (measuring distance 0 millimeters)