-
Phone
15921165535
-
Address
No. 418 Huajing Road, Shanzhong Science and Technology Park, Waigaoqiao Free Trade Zone, Pudong New Area, Shanghai
Duzhi Instrument (Shanghai) Co., Ltd
15921165535
No. 418 Huajing Road, Shanzhong Science and Technology Park, Waigaoqiao Free Trade Zone, Pudong New Area, Shanghai
Accurate interpretation of surface smoothness and contour measurement:
*The initial Talysurf was launched in 1984 and was the first instrument to simultaneously measure texture, shape, and contour. Now, Taylor Hobson's newly developed Form Talysurf intra measurement system enhances Taylor Hobson's position and creates a new global standard for evaluating surface smoothness and shape. With a full millimeter range, a wide selection of interchangeable styles, and * * calibration programs, the internal system is an ideal choice for almost all high-precision applications.
Used for simultaneous measurement of size, shape, and surface roughness, curvature, inclination, roughness, and waviness. Form Talysurf Intra only requires one pass to detect and evaluate all elements. This instrument has a sturdy and durable casing. In practice, it can achieve long-term maintenance without maintenance and maintain accuracy. Its flexibility, reliability, and ease of use make the Form Talysurf Intra a model for precision instruments in many industries. Simple roughness measurements such as Ra can be performed using our Surtronic series products. If you need more levels of measurement analysis and higher-level measurement results, Form Talysurf Intra will be your ideal choice. This instrument perfectly combines industry-leading precision and convenient operation, and has high practical value. It can be used together with processor control modules for fully portable operation, or used as a dedicated detection station with a PC... or both.
Intra workshop roughness profile measuring instrument:
The Form Talysurf Intra has a sturdy and durable casing. Can be used in practiceAchieve long-term maintenance without the need for upkeep and maintain accurate results.The application of a non guided block measurement system can be used to measure waviness, contour, andThe results obtained from other parameters, such as material ratio, are very accurate. The characteristics are:Commonly used three-dimensional contours, conical or spherical surfaces, double contours, Gothic arcs, etcThe analysis mode combines both aspects. Surface curvature, inclination, roughness, and wavesThe mutual influence of texture affects the simultaneous measurement of size, shape, and surface roughnessIn such situations, Intra only requires one measurement to evaluate these elements.Intra data can be wirelessly transmitted, suitable for remote control operation. Configurable PCOr Touch control system, suitable for measuring rooms or production lines in various industriesuse.
|
Main features: |
![]() |
|
technical specifications |
|
|
Sensor type: |
Inductive type |
|
Sampling length: |
0.08, 0.25, 0.8, 2.5, and 8mmR3y, R3z, Ra, Rc, Rda, Rdc, Rdq, RHSC, Rku,RIn, Rlo, RIq, Rmr(C), Rmr, Rp, Rp1max, Rpc, |
|
Roughness parameter: |
Rq, RS, Rsk, RSm, Rt, Rv, Rvo, Rv1max, Rz, Rz(DIN), Rz(JIS), Rz1max Wa, Wc, Wda, Wdc, Wdq, WHSC, Wku, WIn, |
|
Ripple parameter: |
Wlo, WIq, Wmr(c), Wmr, Wp, WPC, Wq, WS, Wsk, Wsm, Wt, Wv, Wvo, Wz Pa, Pc, Pda, Pdc, Pdq, PHSC, Pku, PIn, Plo, |
|
Final filtering parameters: |
Plq, Pmr(c), Pmr, Pp, PPC, Pq, PS, Psk, Psm, Pt, Pv, Pvo, Pz, Pz(JIS) |
|
wave filter: |
Gaussian filter, 2CR filter, 2CR PC filter |
|
Uncertainty in height measurement: |
2% + 6nm |
|
Uncertainty in angle measurement: |
1% (within ± 35 ° angle range) |
|
Uncertainty in radius measurement |
0.1 - 12.5mm= 2% to 0.04% 12.5 - 25mm= 0.04% 25- 1000mm= 0.04% to 0.2% |
|
Lateral Drive RowCheng |
0.1mm - 50mm |
|
Horizontal data point spacing |
0.5μm |
|
Straightness error (Pt) |
0.4 μ m in 5Within 0mm; 0.2 μ m in any 20mm |
|
Measurement/Movement Speed |
10mm/s * large -0.25mm/s * small |
|
Vertical measurementQuantity rangeenclose |
1mm (60mm measuring needle arm); 2mm (120mm measuring needle arm) |
|
Vertical resolution |
16nm within 1mm range; 3nm within 0.2mm |