Park Systems NX20 Atomic Force Microscope

Superior nano measurement tools assist in defect analysis and large-scale sample research

As a defect analysis engineer, your task is to provide results. And the data provided by your instrument cannot allow any errors to exist. Park

NX20， This globally precise large-scale sample atomic force microscope is highly praised in the semiconductor and hard disk industries for its excellent data accuracy.

More powerful defect analysis solutions

Park

The NX20 has unique features that can easily identify the cause of instrument defects and help develop more creative solutions. ****The precision brings you high-resolution data, allowing you to focus more on your work. Meanwhile, True

Non-Contact ™ The (truly non-contact) scanning mode makes the probe sharper and more durable, without the need to spend a lot of time and effort on frequent replacement.

Easy to operate, a blessing for entry-level engineers

The Park NX20 has the industry's most user-friendly design and automated interface, allowing you to use it without spending a lot of time and effort, and without having to supervise junior engineers at this time. With this series of features, you can focus more on solving more significant problems and provide customers with timely and insightful failure analysis.

Technical information:Side wall measurement in three-dimensional structure researchThe * * structure of NX20 allows you to detect the sidewalls and surfaces of samples and measure angles. The numerous functions and uses are exactly what your * * sexual research and profound insights need.

Surface roughness measurement

-

Media and substrate

Surface roughness measurement is one of the key applications of Park NX20, which can bring * * defect analysis and quality assurance.

High resolution electrical scanning mode*Fast scanning capacitance microscope

Non transverse friction conductive atomic force microscope

True Sample Topography™(

Real sample scanning to make piezoelectric creep disappear without a traceOur atomic force microscope is equipped with an effective low-noise Z-axis detector, with a wide noise bandwidth of only 0.02Nm. This can bring about a super sample morphology that is not affected by edge overshoot and does not require calibration. This is just one of the ways Park atomic force microscopy saves you time and brings better data.

Technical features:

Two dimensional flexible guidance scanner, super large

100

μm x 100 μm

scanning range

The XY axis scanner contains symmetrical two-dimensional flexible and high-strength piezoelectric stacks, which can achieve high orthogonal motion and high responsiveness under nanoscale sample scanning while maintaining minimal out of plane motion.Low noise position sensorThe industry-leading low-noise Z-axis detector replaces the Z-voltage as the appearance signal. In addition, low-noise XY closed-loop scanning can reduce the gap between forward and reverse scanning to below 0.15% of the scanning range.

Step by step scanning automation

With the help of an electric sample stage, the step scanning mode allows users to program multi area imaging by themselves. During the repeated imaging process, this automation feature can reduce user workload, thereby improving productivity.

Sliding connection superluminescent diode

(SLD)24Automatic lens loading and unloading

The swallowtail track design allows for easy replacement of atomic force microscope lenses. This design can automatically lock the lens to a pre aligned position and connect it to control electronic components, with a repeat positioning accuracy of only a few micrometers. With the low coherence of superluminescent diodes (SLDs), microscopes can * * image highly reflective surfaces and accurately measure Pico Newton force distance spectra. In addition, the wavelength of the superluminescent diode also solves the interference problem, allowing users to freely use atomic force microscopy in visible spectrum experiments.^{Superior Scanning Probe Microscope Modes and Options Expansion Slot}Simply insert the optional module into the expansion slot to activate the superior scanning probe microscope mode. Thanks to the modular design of the NX series atomic force microscope, the compatibility of its product line has been greatly improved.

high-speedDigital electronic controllerAll NX series atomic force microscopes are controlled and processed by the same NX electronic controller. The controller is a fully digital, 24 bit high-speed electronic unit that ensures ParkTrue Non-Contact24TM

Imaging accuracy and speed in mode. With its low-noise design and high-speed processing unit, this controller is the preferred choice for nanoscale imaging and voltage/current measurement. Embedded digital signal processing brings richer functions to atomic force microscopy, further enhancing cost-effectiveness, making it the best choice for top researchers.

XY

and

Z

Axis detector

Bit signal solution

XY axis (50

The resolution of (μ m) is 0.003

nmThe resolution of the Z-axis (15 μ m) is 0.001nmEmbedded digital signal processing function

Three channel flexible digital lock-in and spring constant correction (thermal measurement method)

Digital Q controlIntegrated signal portDedicated programmable signal input/output port

7 input ports and 3 output ports

high-speed

Z

Axis scanner, scanning range up to15 μmWith the help of high-strength piezoelectric stacks and flexible structures, the resonance frequency of standard Z-axis scanners can reach over 9 kHz (usually 10.5 kHz)

KHz) and the Z-axis movement rate of the probe is not less than 48

Mm/s, making information feedback more accurate. *The scanning range of the large Z-axis can be extended from the standard 15 μ m to 40 μ m (optional long-distance Z-axis scanner).electricXY

Axis sample table, optional encoder