Parker Electrochemical Atomic Force Microscope NX12

Multi functional atomic force microscope platform, meeting the requirements of nanoscale microscopes

Atomic force microscopy (AFM) has the ability to capture images with nanoscale resolution and measure electrical, magnetic, thermal, and mechanical properties.

The nanotube scanning system can be used for high-resolution scanning ion conductivity microscopy (SICM)

Inverted optical microscope (IOM) facilitates the integration of transparent material research and fluorescence microscopy.

Verified byNX10performance

By inverting the optical microscope sample platform, Park

NX12 combines the versatility and accuracy of Park atomic force microscopy. This makes it easier for users to use nanotube technology to study transparent, opaque, or soft or hard samples.

The optimal platform for electrochemical testing

Electrochemical research on batteries, fuel cells, sensors, and corrosion is a rapidly growing field, but many atomic force microscopes cannot directly meet their specific needs. Park

The user-friendly design of NX12 provides convenience for quick operation, thus achieving the functionality and flexibility required by chemical researchers. This mainly includes:

Multi functional and easy-to-use electrochemical cell

Environmental control options for inert gases and humidityCompatibility of dual potentiometersResearchers can utilize

Park NX12

The platform implements various electrochemical applications:

Scanning Electrochemical Microscopy (SECM)

Scanning electrochemical cell microscope (SECCM)

Electrochemical Atomic Force Microscopy (EC-AFM) and Electrochemical Scanning Tunneling Microscopy (EC-STM)

Consider establishing multi-user devices

Park

NX12 has been completely rebuilt to meet the needs of multi-user devices. Other atomic force microscopy solutions lack the necessary versatility to meet the multiple needs of users in this device, making it difficult to reasonably control equipment costs. However, Park

The NX12 is designed to accommodate standard environmental atomic force microscopy imaging, liquid scanning probe microscopy, optical and nano optical imaging, making it one of the most flexible atomic force microscopes.

modular design

Park

NX12 is an atomic force microscope platform tailored specifically for the needs of professional electrochemical researchers.

It provides a universal solution for scanning probe microscopy based on chemical and electrochemical properties, as well as the characteristics of media in gases and liquids, and can be used for a wide range of opaque and transparent materials.

Park

NX12 nanotubes are based on its extensive visible light projection onto scanning probe microscopy technology, making them highly user-friendly.

Park

The NX12 has an accuracy of * * * *, making it an ideal platform for multi-user devices and professional researchers.

multi-functional application

ParkNX12 has a wide range of functions, including PinPoint in liquids

™ Nanomechanics, inverted optical microscopy for locating transparent samples, ion conductivity microscopy for imaging ultra soft samples, and improving the visibility of optical properties of transparent samples.

Comprehensive force spectrum method

Park NX12 provides a complete package for nanomechanical characterization in liquid and air, making it an ideal choice for a wide range of applications

modularization

NX12 modular design, easy installation, strong compatibility, can meet your various experimental needs.

Competitive pricing and flexibility suitable for early career researchers

Early career researchers often did not have enough budget to purchase expensive atomic force microscopes. Park NX12 is not only an affordable entry-level choice, but also provides a modular platform that can continue to grow with career development. It is different from other atomic force microscopes with similar prices, Park

The NX12 is equipped with advanced research grade precision and functionality, providing nanoscale resolution of its surface morphology for transparent and opaque materials in air and liquid. This makes it possible to achieve the best return on investment for new chemistry, materials science, or biochemistry laboratories.

Park

SmartScan™

Click imaging in automatic mode

Park NX12 is equipped with our SmartScan ™ The operating system makes it one of the most user-friendly atomic force microscopes on the market. Its interface is intuitive awesome, even untrained users can scan samples quickly without monitoring. This enables top researchers to focus their experience on solving larger problems and developing better solutions.

Usability

Users of shared laboratories often have diverse backgrounds and varying levels of experience. NX12 provides a simple click interface and automated SmartScan for every user ™ pattern.

Superior functionality, affordable price

The functionality and precision of NX12 are typically only visible in higher priced solutions, including:

Electric focusing platform

The fully integrated atomic force microscope optical components are accompanied by the need for reduced needle tip supervision.

Intelligent scanning makes automated multiple high-quality scans simple.

Park's SmartScan ™ The automation function allows users to click buttons to scan and create automation scripts. NX12 also provides SmartScan for ion conductivity microscopes ™。

Inverted Optical Microscope (IOM)

The inverted optical microscope of NX12 enables users to easily measure transparent samples using nanotube technology.

PinPoint ™ Chemicals (Scanning Electrochemical Microscope)

PinPoint of NX12 ™ The mode enables users to operate the scanning electrochemical microscope with a high-resolution atomic force microscope tip and has extremely high * * degree.

Shuangheng Electrical CompatibilityAllow for simple conversion between scanning tunneling microscopy, atomic force microscopy, and ion conductivity microscopy.
Multi functional humidity and temperature control options
ParkNX12 can control humidity and temperature before and during measurement.

The light can be easily projected onto the driving focusing platformThe system can connect fiber optic probes from various angles, top, side, and bottom during measurement. This method of placing lights on a large scale can be combined with device module design, and optical or nanotechnology accessories can also be added.
Comprehensive force spectrum scheme
Park

NX12 provides a complete package for nanomechanical characterization in liquids and air, making it an ideal choice for a wide range of applications.

Specifications
scanner

Z scanner

AFM

scanning head

Flexible guided high thrust scanner

Scanning range:
15 μ m (optional)30μm)SICM
scanning headFlexible guiding structure driven by multi-layer piezoelectric stack driverScanning range: 15 μ m (optional)

30μm)
XY scanner
Flexible Guided XY Scanner with Closed Loop Control

Scanning range: 100 μ m

×100μm
Drive table

XY drive table travel range: 50
Mm x 50 mm Z drive table travel range: 25

mm

Focus on driving table travel range: 15mmimage

Visual coaxial imaging of sample surface and cantilevervision:

eight hundred and fortyμ m × 630 μ m (10x objective lens)camera

:5 MPixel (default), 1M

Pixel (optional)objective lens10 times (NA

0.23) Ultra long working distance lens20 times (NA0.35) High resolution, long working distance lens

electronsignal processingADC: 18 channels

24 bit ADC's X, YAnd Z-scanner position sensor DAC:17 channels

X, Y of 20 bit DAC

Positioning with Z scanner
integrated function

3-channel digital lock-in amplifier elasticity coefficient calibration (thermal method) data Q control
Options/Modes

Standard imaging

:True non-contact mode, contact mode, lateral friction microscopy (LFM),Phase imaging mode, tap mode,