Park Systems XE15 Atomic Force Microscope

World class precision and powerful functionalityParkCharacteristics of Atomic Force Microscopy Products

Park

XE15 has multiple special functions, making it the perfect choice for shared laboratories to process various samples, researchers to conduct multivariate experiments, and failure analysts to study chips. A reasonable price combined with robust performance settings makes it the most cost-effective large-scale sample atomic force microscope in the industry.MultiSample™^{(Multisampling)}TM

）Scanner brings convenient sample measurement

One time automatic imaging of diverse products

Specially designed multi sample clamp, capable of carrying up to 16 independent samples

Fully automatic XY sample stage with a travel range of 200 mm x 200 mm.

Improving scanning accuracy without inter axis coupling

Two independent closed-loop XY and Z flat plate scanning

Flat panel and linear XY scanning can reach 100 μ m x 100 μ m, with minimal residual bending

The out of plane movement within the entire scanning range is less than 2nm

Powerful scanner with a scanning range of 25 μ m Z

**Height measurementNon-Contact™^{(Truly non-contact)}TM

）Extend the lifespan of the needle tip, improve sample preservation and accuracy

Its Z-scan bandwidth is 10 times that of piezoelectric tube based systems

Non contact can reduce needle tip wear and extend service life

Higher imaging resolution than similar atomic force microscopes

Reduce sample interference and improve scanning accuracy

Provide the best user experience

Open side access improves sample and needle tip replacement efficiency

Pre aligned needle tip installation and seamless axial top view method enable simple and intuitive laser alignment

Swallowtail lock sealing plate facilitates lens disassembly

The interface has an automatic setting function, which is convenient for users to use

Multiple modes and options

The comprehensive measurement mode and characteristic settings are our best universal atomic force microscope

Multiple optional accessories and updates, superior expansion performance

Provide advanced electrical measurements for defect analysis

Product Features100um x 100 umScanning RangeXYsoft‘

Sexual orientation scannerThe XY scanner includes a system for two-dimensional bending and strong piezoelectric stacking, which can enableSignificant orthogonal motion is formed by minimal out of plane movement

And it can respond quickly and achieve * * sample nanoscale scanning.Flexible guidance with strong forceZ

scanner

Under the guidance of the strong piezoelectric stack driving and bending structure, its hardness allows the scanner to move vertically at high speed, which is faster than traditional atomic force microscope scanners. *The large Z-scan range can be extended by 12 μ m to 25 μ m when paired with a remote Z-scanner (optional).

Ultra bright diode head with sliding connection

By sliding the atomic force microscope lens along a wedge-shaped orbit, it can be easily inserted or removed. Low coherence superluminescent diode heads can achieve imaging of highly reflective surfaces and measurement of force moment spectra. The wavelength of the ultra bright diode head helps alleviate interference issues, so users can also use this product in visible spectrum experiments.

Multi sample clamp

Specially designed multi sample clamp, capable of carrying up to 16 independent samples, automatically scanned in sequence by a multi sampling scanner. The special clamp design reserves a side channel for contacting the sample needle tip.Optional encoderXY

Automatic sample stage

The automatic integration of XY stage allows for easy and precise control of the measurement position of the sample. The travel range of the XY sample stage can be configured to 150

Mm x 150 mm or 200 mm x 200 mm. If an encoder is used in conjunction with an automatic stage, it can improve the accuracy and repeatability of sample positioning. The resolution of the encoding XY stage during operation is 1 μ m, and the repetition rate is 2 μ m. The resolution of the Z-stage encoding is 0.1

μm， The repetition rate is 1 μ m.High resolution digital zoom sensor cameraThe high-resolution digital sensor camera utilizes direct coaxial optics and has zoom function, ensuring clear image quality regardless of whether it is pan or not.

Automatic vertical alignment

ZCarrier and Focus CarrierThe Z-stage and focusing stage can engage the cantilever onto the surface of the sample while ensuring clear and stable user visibility. The focusing stage is automatically operated by software control, thus meeting the precision requirements for transparent sample and liquid component applications.Decoupling of curved substrateXY

and

ZscannerThe Z scanner is completely decoupled from the XY scanner. The XY scanner moves the sample horizontally, while the Z scanner moves the probe vertically.This configuration achieves * small out of plane movementflat-plateXYscan

This XY scan also has

High orthogonality and linearity

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Industry * Low background noiseTo detect the characteristics of small samples and assist in fast motion planar imaging, ParkSystems has designed industry standard equipment with a minimum background noise of 0.5A. Use 'zero scan' to detect local noise data.

True non-contact mode extends needle tip lifespanThe XE series atomic force microscope has been successfully paired with the unique non-contact mode of the Brick Power Z-scan system. In true non-contact mode, attraction rather than repulsion is usedInternal atomic force

.

The truly non-contact mode successfully maintains the nanoscale spacing between the needle tip samples, improves the atomic force microscope images, and maintains the sharpness of the needle tipEffectively extended the lifespan of the needle tip

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Pre aligned cantilever supportPre installed on the probe support, therefore no needStrictly align the laser beam.

High resolution direct coaxial optical componentsUsers can directly view the sample from above, manipulate the surface of the sample, and thusIt is easy to find the target area.High resolution digital cameras have zoom function, which ensures clear image quality regardless of pan or tilt.belt

DSP

Control chip

XE

Control electronic components

The nanoscale signals emitted by atomic force microscopy will be processed by high-performance Park

XE electronic components control and process. Park

XE electronic components are designed with low noise and equipped with high-speed processing units, which can successfully achieve true non-contact performance ™ Mode is an ideal choice for nanoscale imaging and precise measurement of voltage and current.

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High performance processing unit with 600 MHz and 4800 MIPS speed