Park Systems XE7 Atomic Force Microscope

****High performance

Among the same level products, Park XE7 can provide measurement results with * high nanometer level resolution. Thanks to its unique atomic force microscope architecture, which features independent XY and Z-axis flexible scanners, XE7 is able to achieve smooth, orthogonal, and linear scanning measurements, enabling imaging and measurement of sample characteristics. In addition, Park's unique True

Non-Contact ™ The mode can also bring you * * * * image effects, and the probe can maintain the resolution of the image even after multiple scans.

Meet current and future needs

In Park

With the help of XE7, both the present and the future are under your control. Park XE7 comes with the industry's * * * measurement mode. These modes not only meet your current needs, but also take into account the constantly changing demands of the future. Furthermore, XE7 features an open design that allows you to integrate other accessories and instruments to meet your specific research needs.

Easy to use and high productivity

Park XE7 has a simple graphical user interface and automated tools, allowing even beginners to quickly scan samples. Whether it is pre collimated probes, simple sample and probe replacement, easy laser collimation, top-down coaxial viewing angle, user-friendly scanning control and software processing, XE7 can fully promote the improvement of research efficiency..

Economical benefits surpass system costs

Park XE7 is not only a cost-effective research grade atomic force microscope, but also a low-cost atomic force microscope. The True installed in Park XE7Non-Contact ™ The mode allows users to avoid frequent replacement of expensive probes, and it is equipped with the industry's most advanced scanning modes, with excellent compatibility, allowing you to upgrade system functions at any time, thereby extending the product's service life. Park XE7 is equipped with Park

All * * technologies from Systems, and the prices are very affordable. XE7 also pays great attention to detail in its design, making it an ideal choice to help you complete your research accurately and within budget.

Technical Specifications

XYscanner

Closed loop control single module flexible XY scanner.

Scanning range: 50 μ m × 50 μ m (optional)

100 μm×100 μm, 10 μm×10 μm )

Z

scanner

Flexible guided high-intensity scanner

Scanning range: 12 μ m (optional 25)

μm)

Sample stand

XY table working range:

13 × 13 mm

Z-platform work scope:

29.5 mm

Focus table working range: 70 mm

optical system

Direct view coaxial optical system for observable samples and probes

10X objective lens (optional 20X)

Field of view: 480 × 360 μ m

CCD: 1M pixels (pixel resolution: 0.4 μ m)

circuit system

High performance DSP

: 600 MHz with 4800 MIPS